12th IEEE VLSI Test Symposium: April 25-28, 1994, Cherry Hill, New Jersey: Proceedings Institute of Electrical and Electronics Engineers

ISBN: 9780818654404

Published: January 1st 1994

Paperback

466 pages


Description

12th IEEE VLSI Test Symposium: April 25-28, 1994, Cherry Hill, New Jersey: Proceedings  by  Institute of Electrical and Electronics Engineers

12th IEEE VLSI Test Symposium: April 25-28, 1994, Cherry Hill, New Jersey: Proceedings by Institute of Electrical and Electronics Engineers
January 1st 1994 | Paperback | PDF, EPUB, FB2, DjVu, AUDIO, mp3, RTF | 466 pages | ISBN: 9780818654404 | 10.16 Mb

Proceedings of the symposium held in Cherry Hill, New Jersey, April 1994. Technical sessions are devoted to synthesis and testability- testable mixed-signal circuit designs- built-in self-test- test generation & fault simulation- on-line testing-MoreProceedings of the symposium held in Cherry Hill, New Jersey, April 1994.

Technical sessions are devoted to synthesis and testability- testable mixed-signal circuit designs- built-in self-test- test generation & fault simulation- on-line testing- defect coverage & test quality- advanced test generat



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